Focused Ion Beam and Advanced Electron Microscopy for Minerals: Insights and Outlook from Bismuth Sulphosalts.

MLA

Ciobanu, Cristiana L., et al. “Focused Ion Beam and Advanced Electron Microscopy for Minerals: Insights and Outlook from Bismuth Sulphosalts.” Minerals (2075-163X), vol. 6, no. 4, Dec. 2016, p. 112. EBSCOhost, https://doi.org/10.3390/min6040112.

APA

Ciobanu, C. L., Cook, N. J., Maunders, C., Wade, B. P., & Ehrig, K. (2016). Focused Ion Beam and Advanced Electron Microscopy for Minerals: Insights and Outlook from Bismuth Sulphosalts. Minerals (2075-163X), 6(4), 112. https://doi.org/10.3390/min6040112

Chicago

Ciobanu, Cristiana L., Nigel J. Cook, Christian Maunders, Benjamin P. Wade, and Kathy Ehrig. 2016. “Focused Ion Beam and Advanced Electron Microscopy for Minerals: Insights and Outlook from Bismuth Sulphosalts.” Minerals (2075-163X) 6 (4): 112. doi:10.3390/min6040112.