A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited).

Authors :: Nilson, P. M.
Ehrne, F.
Mileham, C.
Mastrosimone, D.
Jungquist, R. K.
Taylor, C.
Stillman, C. R.
Ivancic, S. T.
Boni, R.
Hassett, J.
Lonobile, D. J.
Kidder, R. W.
Shoup III, M. J.
Solodov, A. A.
Stoeckl, C.
Theobald, W.
Froula, D. H.
Hill, K. W.
Gao, L.
Bitter, M.
Source :: Review of Scientific Instruments. Nov2016, Vol. 87 Issue 11, p11D504-1-11D504-5. 5p. 3 Diagrams, 4 Graphs.
Publication Year :: 2016
Abstract: A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed. [ABSTRACT FROM AUTHOR]