Investigation of amorphous SiOx layer on gold surface for Surface Plasmon Resonance measurements.

MLA

Herth, Etienne, et al. “Investigation of Amorphous SiOx Layer on Gold Surface for Surface Plasmon Resonance Measurements.” Microelectronic Engineering, vol. 163, Sept. 2016, pp. 43–48. EBSCOhost, https://doi.org/10.1016/j.mee.2016.04.014.

APA

Herth, E., Zeggari, R., Rauch, J.-Y., Remy-Martin, F., & Boireau, W. (2016). Investigation of amorphous SiOx layer on gold surface for Surface Plasmon Resonance measurements. Microelectronic Engineering, 163, 43–48. https://doi.org/10.1016/j.mee.2016.04.014

Chicago

Herth, Etienne, Rabah Zeggari, Jean-Yves Rauch, Fabien Remy-Martin, and Wilfrid Boireau. 2016. “Investigation of Amorphous SiOx Layer on Gold Surface for Surface Plasmon Resonance Measurements.” Microelectronic Engineering 163 (September): 43–48. doi:10.1016/j.mee.2016.04.014.