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Accurate and integrated temperature measurement.

Authors :
Lecklider, Tom
Source :
EE: Evaluation Engineering. Aug2016, Vol. 55 Issue 8, p24-25. 2p.
Publication Year :
2016

Abstract

The article focuses on the analog sensors developed by instrument companies Analog Devices Inc. and Texas Instruments based on the different of two transistors operated with different densities. It provides the formula and equation of the sensors and discusses their interesting refinement. It also mentions the refinement of the analog and digital sensors to perform and support accurate wide-range temperature sensing.

Details

Language :
English
ISSN :
01490370
Volume :
55
Issue :
8
Database :
Academic Search Index
Journal :
EE: Evaluation Engineering
Publication Type :
Periodical
Accession number :
117077099