Cite
Modeling Erratic Behavior Due to High Current Filamentation in Bipolar Structures Under Dynamic Avalanche Conditions.
MLA
Sinha, Dheeraj Kumar, et al. “Modeling Erratic Behavior Due to High Current Filamentation in Bipolar Structures Under Dynamic Avalanche Conditions.” IEEE Transactions on Electron Devices, vol. 63, no. 8, Aug. 2016, pp. 3185–92. EBSCOhost, https://doi.org/10.1109/TED.2016.2584102.
APA
Sinha, D. K., Chatterjee, A., & Schrimpf, R. D. (2016). Modeling Erratic Behavior Due to High Current Filamentation in Bipolar Structures Under Dynamic Avalanche Conditions. IEEE Transactions on Electron Devices, 63(8), 3185–3192. https://doi.org/10.1109/TED.2016.2584102
Chicago
Sinha, Dheeraj Kumar, Amitabh Chatterjee, and Ronald D. Schrimpf. 2016. “Modeling Erratic Behavior Due to High Current Filamentation in Bipolar Structures Under Dynamic Avalanche Conditions.” IEEE Transactions on Electron Devices 63 (8): 3185–92. doi:10.1109/TED.2016.2584102.