Detection and characterization of singly deuterated silylene, SiHD, via optical spectroscopy.

Singly deuterated silylene has been detected and characterized in the gas-phase using high-resolution, two-dimensional, optical spectroscopy. Rotationally resolved lines in the 000X¹A' → A¹A″ band are assigned to both c-type perpendicular transition and additional parallel, axis-switching induced bands. The extracted rotational constants were combined with those for SiH2 and SiD2 to determine an improved equilibrium bond length, rSiH, and bond angle, θ, of 1.5137 ± 0.0003 Å and 92.04? ± 0.05?, and 1.4853 ± 0.0005 Å and 122.48? ± 0.08? for the X¹A' (0,0,0) and A¹A″(0,0,0) state respectively. The dispersed fluorescence consists of a long progression in the A¹A″(0,0,0) →X¹A'(0,ν2,0) emission which was analyzed to produce vibrational parameters. A strong quantum level dependence of the rotationally resolved radiative decay curves is analyzed. [ABSTRACT FROM AUTHOR]