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The Incidence, Treatment and Risk Factors of Candidiasis in Very Low Birth Weight Infants.

Authors :
Ha Young Shin
Ji Na Park
Yun Hye Shin
Da Young Yun
Park, Hyun A.
Jong Hee Hwang
Source :
Neonatal Medicine. Feb2016, Vol. 23 Issue 1, p35-42. 8p.
Publication Year :
2016

Abstract

Purpose: Candidiasis is an important morbidity among very low birth weight infants (VLBWI). There is a little data on the risk factors in VLBWI. This study was done to describe the incidence, treatment, and risk factors of candidiasis in VLBWI. Methods: From September 2008 to December 2011, medical records of 130 infants with VLBWI in Inje University Ilsan Paik hospital neonatal intensive care unit (NICU) were reviewed retrospectively. Seventeen infants were diagnosed with candidiasis and treated with antifungal agent. Patients were divided into the candidiasis group (CAN, n=17), the bacterial sepsis group (BAC, n=34), and the non-sepsis group (Non- SEP, n=74). Demographic findings and factors associated with candidiasis were compared between these groups. Results: The mean gestational age was significantly low in the CAN group, but birth weight was not significantly different between the groups. The maternal demographic findings were not significantly different between the groups. The incidence of respiratory distress syndrome (RDS) is higher in the CAN group compared to these groups (P<0.05). The durations of intubation and central venous line were significantly longer in the CAN group than in the other groups (P<0.05). In the logistic regression analysis, the duration of central venous line is the significant factor for candidiasis (P =0.003, odd ratio: 1.56, 95% confidence interval: 1.39-1.68). Conclusion: The incidence of candidiasis in VLBWI was 13.1% and the risk factor for candidiasis was longer duration of central venous line in our study. [ABSTRACT FROM AUTHOR]

Details

Language :
Korean
ISSN :
22879412
Volume :
23
Issue :
1
Database :
Academic Search Index
Journal :
Neonatal Medicine
Publication Type :
Academic Journal
Accession number :
115905069
Full Text :
https://doi.org/10.5385/nm.2016.23.1.35