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Optical Demonstration of THz, Dual-Polarization Sensitive Microwave Kinetic Inductance Detectors.

Authors :
Dober, B.
Austermann, J.
Beall, J.
Becker, D.
Che, G.
Cho, H.
Devlin, M.
Duff, S.
Galitzki, N.
Gao, J.
Groppi, C.
Hilton, G.
Hubmayr, J.
Irwin, K.
McKenney, C.
Li, D.
Lourie, N.
Mauskopf, P.
Vissers, M.
Wang, Y.
Source :
Journal of Low Temperature Physics. Jul2016, Vol. 184 Issue 1/2, p173-179. 7p.
Publication Year :
2016

Abstract

Polarization sensitive, microwave kinetic inductance detectors (MKIDs) are under development for the next generation BLAST instrument (BLAST-TNG). BLAST-TNG is a balloon-borne submillimeter polarimeter designed to study magnetic fields in diffuse dust regions and molecular clouds. We present the design and performance of feedhorn-coupled, dual-polarization sensitive MKIDs fabricated from TiN/Ti multilayer films, which have been optimized for the 250 $$\upmu $$ m band. Measurements show effective selection of linear polarization and good electrical isolation between the orthogonally crossed X and Y detectors within a single spatial pixel. The detector cross-polar coupling is $$<$$ 3 %. Passband measurements are presented, which demonstrate that the desired band-edges (1.0-1.4 THz) have been achieved. We find a near linear response to the optical load from a blackbody source, which has been observed in previous devices fabricated from TiN. Blackbody-coupled noise measurements demonstrate that the sensitivity of the detectors is limited by photon noise when the optical load is greater than 1 pW. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00222291
Volume :
184
Issue :
1/2
Database :
Academic Search Index
Journal :
Journal of Low Temperature Physics
Publication Type :
Academic Journal
Accession number :
115657503
Full Text :
https://doi.org/10.1007/s10909-015-1434-3