Cite
Common Bias Readout for TES Array on Scanning Transmission Electron Microscope.
MLA
Yamamoto, R., et al. “Common Bias Readout for TES Array on Scanning Transmission Electron Microscope.” Journal of Low Temperature Physics, vol. 184, no. 1/2, July 2016, pp. 454–59. EBSCOhost, https://doi.org/10.1007/s10909-016-1562-4.
APA
Yamamoto, R., Sakai, K., Maehisa, K., Nagayoshi, K., Hayashi, T., Muramatsu, H., Nakashima, Y., Mitsuda, K., Yamasaki, N., Takei, Y., Hidaka, M., Nagasawa, S., Maehata, K., & Hara, T. (2016). Common Bias Readout for TES Array on Scanning Transmission Electron Microscope. Journal of Low Temperature Physics, 184(1/2), 454–459. https://doi.org/10.1007/s10909-016-1562-4
Chicago
Yamamoto, R., K. Sakai, K. Maehisa, K. Nagayoshi, T. Hayashi, H. Muramatsu, Y. Nakashima, et al. 2016. “Common Bias Readout for TES Array on Scanning Transmission Electron Microscope.” Journal of Low Temperature Physics 184 (1/2): 454–59. doi:10.1007/s10909-016-1562-4.