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XAFS16 at KIT: Five Days of Cutting-Edge X-ray Science in Karlsruhe.

Authors :
Rothe, Jörg
Grunwaldt, Jan-Dierk
Doyle, Stephen
Source :
Synchrotron Radiation News. Mar/Apr2016, Vol. 29 Issue 2, p9-10. 2p.
Publication Year :
2016

Abstract

The sixteenth international conference on X-ray Absorption Fine Structure, XAFS16, was held August 23–28, 2015, at the Karlsruhe Institute of Technology (KIT) in Germany. Since the first such meeting in 1981, the XAFS conference series has become the foremost international meeting covering developments and applications in X-ray absorption spectroscopy. Jointly organized by KIT, DESY (Hamburg), HZB (Berlin), and the European XFEL (Hamburg), under the auspices of the International X-ray Absorption Society (IXAS), the XAFS16 conference hosted over 550 participants (including more than 160 young scientists) from 37 different countries, establishing a new record for the number of participants. The local organization was provided by the KIT institutes INE, IKFT, and ITCP and the ANKA synchrotron facility, with Jan-Dierk Grunwaldt leading the local organizing committee. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
08940886
Volume :
29
Issue :
2
Database :
Academic Search Index
Journal :
Synchrotron Radiation News
Publication Type :
Academic Journal
Accession number :
114081593
Full Text :
https://doi.org/10.1080/08940886.2016.1149426