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EDI CON China 2016 Features More EMC, Radar and Semiconductor Content.

Authors :
Hindle, Patrick
Source :
Microwave Journal. Mar2016, Vol. 59 Issue 3, p68-71. 4p.
Publication Year :
2016

Abstract

The article offers information on the 2016 Electronic Design Innovation Conference (EDI CON) China, China Electrotechnical Society's Electromagnetic Technology Conference & Exhibition (EMC) China, and the China Radar Industry Association conference on April 19-21, 2016. Topics discussed include silicon-on-insulator (SOI) semiconductor technology, wireless communication, and fire control radar.

Details

Language :
English
ISSN :
01926225
Volume :
59
Issue :
3
Database :
Academic Search Index
Journal :
Microwave Journal
Publication Type :
Periodical
Accession number :
113490307