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Presence of monovalent oxygen anions in oxides demonstrated using X-ray photoelectron spectra.

Authors :
Wu, L. Q.
Li, S. Q.
Li, Y. C.
Li, Z. Z.
Tang, G. D.
Qi, W. H.
Xue, L. C.
Ding, L. L.
Ge, X. S.
Source :
Applied Physics Letters. 1/11/2016, Vol. 108 Issue 2, p1-4. 4p. 2 Charts, 3 Graphs.
Publication Year :
2016

Abstract

The oxygen vacancy model has been used to explain the magnetic and electrical transport properties of dilute magnetic semiconductors and resistive switching. In particular, some authors have claimed that they found a symmetric peak corresponding to the oxygen vacancies in O1s photoelectron spectra. In this paper, using X-ray photoelectron spectra with argon ion etching, it is shown that this symmetric peak may also be interpreted as being related to O1- anions, rather than to oxygen vacancies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
108
Issue :
2
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
112326519
Full Text :
https://doi.org/10.1063/1.4939976