Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex.

MLA

Chandrasekaran, Santosh, et al. “Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex.” Journal of Neuroscience, vol. 35, no. 50, Dec. 2015, pp. 16450–62. EBSCOhost, https://doi.org/10.1523/JNEUROSCI.1573-15.2015.

APA

Chandrasekaran, S., Navlakha, S., Audette, N. J., McCreary, D. D., Joe Suhan, Bar-Joseph, Z., & Barth, A. L. (2015). Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex. Journal of Neuroscience, 35(50), 16450–16462. https://doi.org/10.1523/JNEUROSCI.1573-15.2015

Chicago

Chandrasekaran, Santosh, Saket Navlakha, Nicholas J. Audette, Dylan D. McCreary, Joe Suhan, Ziv Bar-Joseph, and Alison L. Barth. 2015. “Unbiased, High-Throughput Electron Microscopy Analysis of Experience-Dependent Synaptic Changes in the Neocortex.” Journal of Neuroscience 35 (50): 16450–62. doi:10.1523/JNEUROSCI.1573-15.2015.