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Conduction and dielectric polarization in Se thin films
- Source :
-
Vacuum . Nov2003, Vol. 72 Issue 3, p307. 6p. - Publication Year :
- 2003
-
Abstract
- Se films were prepared by thermal evaporation technique in thickness range 150–8500 A˚. X-ray diffraction measurements showed that Se films are in the amorphous state. The ac conductivity and dielectric properties of the amorphous Se films have been investigated in the frequency range 100–100 KHz and 100–400 K temperature range. The ac conductivity <f>σac(ω)</f> is found to be proportional to <f>ωs</f> where <f>s</f><1. The temperature dependence of both ac conductivity and the parameter <f>s</f> is reasonably well interpreted by the correlated barrier (CBH) model. The dc conductivity at the room temperature was also studied in the same thickness range. It was concluded that the same mechanism of carrier motion might be dominant in both ac polarization and dc conduction. This carrier transport mechanism might be electronic. [Copyright &y& Elsevier]
- Subjects :
- *OPTICAL diffraction
*X-ray crystallography
*OPTICAL polarization
Subjects
Details
- Language :
- English
- ISSN :
- 0042207X
- Volume :
- 72
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Vacuum
- Publication Type :
- Academic Journal
- Accession number :
- 11173206
- Full Text :
- https://doi.org/10.1016/j.vacuum.2003.08.008