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Observation of Oriented Organic Semiconductor using Photo-Electron Emission Microscope (PEEM) with Polarized Synchrotron.
- Source :
-
Molecular Crystals & Liquid Crystals . 2015, Vol. 622 Issue 1, p44-49. 6p. - Publication Year :
- 2015
-
Abstract
- We have developed photoelectron emission microscope (PEEM) system with excitation of linearly polarized synchrotron X-rays at 30° incidence angle arrangement. The morphology, electronic structure, orientation for P3HT:PCBM hybrid films have been investigated using the PEEM instrument. The sulphur 1s near-edge X-ray-absorption fine structure (NEXAFS) spectra at micro-domains were obtained, where sulphur atoms of thiophene ring were detected. The nature and symmetry in the S 1s excitations of P3HT model cluster were elucidated by DFT calculations that we performed to assign resonant peaks in absorption spectra. We demonstrate that the orientation at micro-domains can be deduced from photon-energy dependencies of PEEM images. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15421406
- Volume :
- 622
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Molecular Crystals & Liquid Crystals
- Publication Type :
- Academic Journal
- Accession number :
- 111728831
- Full Text :
- https://doi.org/10.1080/15421406.2015.1096989