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Design and implementation of a micron-sized electron column fabricated by focused ion beam milling.

Authors :
Wicki, Flavio
Longchamp, Jean-Nicolas
Escher, Conrad
Fink, Hans-Werner
Source :
Ultramicroscopy. Jan2016, Vol. 160, p74-79. 6p.
Publication Year :
2016

Abstract

We have designed, fabricated and tested a micron-sized electron column with an overall length of about 700 microns comprising two electron lenses; a micro-lens with a minimal bore of 1 micron followed by a second lens with a bore of up to 50 microns in diameter to shape a coherent low-energy electron wave front. The design criteria follow the notion of scaling down source size, lens-dimensions and kinetic electron energy for minimizing spherical aberrations to ensure a parallel coherent electron wave front. All lens apertures have been milled employing a focused ion beam and could thus be precisely aligned within a tolerance of about 300 nm from the optical axis. Experimentally, the final column shapes a quasi-planar wave front with a minimal full divergence angle of 4 mrad and electron energies as low as 100 eV. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03043991
Volume :
160
Database :
Academic Search Index
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
111565580
Full Text :
https://doi.org/10.1016/j.ultramic.2015.09.013