Atomic-scale characterization of Si(110)/6H-SiC(0001) heterostructure by HRTEM.

MLA

Li, L. B., et al. “Atomic-Scale Characterization of Si(110)/6H-SiC(0001) Heterostructure by HRTEM.” Materials Letters, vol. 163, Jan. 2016, pp. 47–50. EBSCOhost, https://doi.org/10.1016/j.matlet.2015.10.017.

APA

Li, L. B., Chen, Z. M., Zang, Y., & Feng, S. (2016). Atomic-scale characterization of Si(110)/6H-SiC(0001) heterostructure by HRTEM. Materials Letters, 163, 47–50. https://doi.org/10.1016/j.matlet.2015.10.017

Chicago

Li, L.B., Z.M. Chen, Y. Zang, and S. Feng. 2016. “Atomic-Scale Characterization of Si(110)/6H-SiC(0001) Heterostructure by HRTEM.” Materials Letters 163 (January): 47–50. doi:10.1016/j.matlet.2015.10.017.