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Lattice-level observation of the elastic-to-plastic relaxation process with subnanosecond resolution in shock-compressed Ta using time-resolved in situ Laue diffraction.

Authors :
Wehrenberg, C. E.
Barton, N. R.
Coppari, F.
Fratanduono, D.
Huntington, C. M.
Maddox, B. R.
Park, H.-S.
Prisbrey, S. T.
Remington, B. A.
Rudd, R. E.
Comley, A. J.
Plechaty, C.
Source :
Physical Review B: Condensed Matter & Materials Physics. Sep2015, Vol. 92 Issue 10, p104305-1-104305-8. 8p.
Publication Year :
2015

Abstract

We report direct lattice-level measurements of plastic relaxation kinetics through time-resolved, in situ Laue diffraction of shock-compressed single-crystal [001 ] Ta at pressures of 27-210 GPa. For a 50-GPa shock, a range of shear strains is observed extending up to the uniaxial limit for early data points (<0.6 ns), and the average shear strain relaxes to a near steady state over ~1 ns. For 80- and 125-GPa shocks, the measured shear strains are fully relaxed already at 200 ps, consistent with rapid relaxation associated with the predicted threshold for homogeneous nucleation of dislocations occurring at shock pressure ~65 GPa. The relaxation rate and shear stresses are used to estimate the dislocation density, and these quantities are compared to the results of other high-pressure work, flow stress models, and molecular dynamics simulations. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10980121
Volume :
92
Issue :
10
Database :
Academic Search Index
Journal :
Physical Review B: Condensed Matter & Materials Physics
Publication Type :
Academic Journal
Accession number :
110870523
Full Text :
https://doi.org/10.1103/PhysRevB.92.104305