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Application of a VUV Fourier transform spectrometer and synchrotron radiation source to measurements of. VI. The ε(0,0) band of NO.

Authors :
Cheung, A. S-C.
Wong, A. L.
Lo, D. H-Y.
Leung, K. W-S.
Yoshino, K.
Thorne, A. P.
Murray, J. E.
Imajo, T.
Ito, K.
Matsui, T.
Source :
Journal of Chemical Physics. 10/22/2003, Vol. 119 Issue 16, p8373. 6p. 5 Charts, 4 Graphs.
Publication Year :
2003

Abstract

The ε(0,0) (D [sup 2]Σ[sup +]–X [sup 2]Π[sub r]) band of NO has been recorded by using a vacuum ultraviolet Fourier transform spectrometer from Imperial College, London, with synchrotron radiation at the Photon Factory, KEK, Japan, as a continuum light source. Analysis of the ε(0,0) band provides accurate rotational line positions and term values as well as the photoabsorption cross sections. Molecular constants of the v=0 level of the D [sup 2]Σ state have been determined as T[sub 0]=53 291.10±0.10 cm[sup -1], B[sub 0]=1.991 07±0.000 05 cm[sup -1], and D[sub 0]=(6.6±0.1)×10[sup -6] cm[sup -1]. Accurate rotational line strengths have also been obtained and the sum of the line strengths for all rotational lines is determined as 2.18×10[sup -15] cm[sup 2] cm[sup -1]. The band oscillator strength of the ε(0,0) band is determined to be (2.47±0.12)×10[sup -3]. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00219606
Volume :
119
Issue :
16
Database :
Academic Search Index
Journal :
Journal of Chemical Physics
Publication Type :
Academic Journal
Accession number :
11054629
Full Text :
https://doi.org/10.1063/1.1611171