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Atomic force microscopy—a visual probe to characterize nanodosimetric devices

Authors :
Gameiro, C.G.
Alves Jr., S.
da Silva Jr., E.F.
Achete, C.A.
Simão, R.A.
Santa-Cruz, P.A.
Source :
Materials Characterization. Mar2003, Vol. 50 Issue 2/3, p109. 8p.
Publication Year :
2003

Abstract

We have developed an ultraviolet dosimeter based on lanthanide β-diketonate complexes nanofilms. The UV photodegradation of the nanofilm photonic properties allows it to act as a dosimeter. To develop a better understanding of this UV photodegradation process, we have performed atomic force microscopy (AFM) and in situ mass spectrometry (under ultraviolet exposure) studies of the nanofilms. The results indicate that the UV photodegradation phenomenon does not lead to any microstructural or morphological changes of the samples. Therefore, we reason that the degradation process should be related to changes in the energy transfer between ligands and the central ion of the complexes or else to the creation of nonradiative pathways corroborating for a luminescence quenching related to the UV exposure dose. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
10445803
Volume :
50
Issue :
2/3
Database :
Academic Search Index
Journal :
Materials Characterization
Publication Type :
Academic Journal
Accession number :
11042673
Full Text :
https://doi.org/10.1016/S1044-5803(03)00076-7