Back to Search Start Over

Reliability test of a RF MEMS varactor based on a double actuation mechanism.

Authors :
Cazzorla, A.
Farinelli, P.
Sorrentino, R.
Margesin, B.
Source :
Microelectronics Reliability. Aug2015, Vol. 55 Issue 9/10, p1906-1910. 5p.
Publication Year :
2015

Abstract

This paper presents the design and reliability tests of a novel micro-electro mechanical varactor based on a double actuation mechanism allowing for overall capacitive ratio C r of 5.2 and continuous capacitive ratio C r ⁎ of 2.6. The device has been modeled in ANSYS® multiphysics environment and manufactured by using the 8-masks FBK-irst RF MEMS process. The performance was tested on 10 samples showing good mechanical reproducibility and negligible capacitance ratios variation (C r = 5.2 ± 5%, C r ⁎ = 2.6 ± 4%). Self-biasing tests have been performed by applying an equivalent V rms on the RF central conductor, showing an insignificant capacitance ratio variation up to 13.5 V rms . Finally, cycling test was performed on the DUT up to 10 8 cycles, showing negligible variation of the capacitance. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00262714
Volume :
55
Issue :
9/10
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
110216184
Full Text :
https://doi.org/10.1016/j.microrel.2015.07.003