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Orientation contrast of secondary electron images from electropolished metals.
- Source :
-
Ultramicroscopy . Sep2015, Vol. 156, p41-49. 9p. - Publication Year :
- 2015
-
Abstract
- Orientation contrast obtained by an in-lens secondary electron detector in a scanning electron microscope from electropolished/etched metals is reported. The imaging conditions for obtaining such orientation contrast are defined. The mechanism responsible for the formation of the orientation contrast is explained, and an application example of this new imaging method is given. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 03043991
- Volume :
- 156
- Database :
- Academic Search Index
- Journal :
- Ultramicroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 109357184
- Full Text :
- https://doi.org/10.1016/j.ultramic.2015.05.005