Identification of a Temperature-Sensitive Mutation in the ribE Gene of an Escherichia coli Keio Collection Strain.

This article presents a study on a temperature-sensitive mutation in the ribE gene of an Escherichia coli Keio collection strain. It discusses the classification of Escherichia coli genes, generation of temperature-sensitive mutants, the growth defect of the Keio deletion strain, and growth analysis on riboflavin-complemented media.