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The role of gap states on energy level alignment at an α-NPD/HAT(CN)6 charge generation interface.

Authors :
Yang, Jin-Peng
Bussolotti, Fabio
Li, Yan-Qing
Zeng, Xiang-Hua
Kera, Satoshi
Tang, Jian-Xin
Ueno, Nobuo
Source :
Organic Electronics. Sep2015, Vol. 24, p120-124. 5p.
Publication Year :
2015

Abstract

We report the effect of gap states on energy level alignment in a typical organic charge generation interface of N,N-bis(1-naphthyl)-N,N-diphenyl-1,1-biphenyl-4,4-diamine (α-NPD)/hexaazatriphenylene−hexacarbonitrile [HAT(CN) 6 ] by using ultraviolet and X-ray photoemission spectroscopy. The gap states tailed from the highest occupied molecular orbital (HOMO) onset of α-NPD dominate the Fermi level pinning at the α-NPD(<1.6 nm)/HAT(CN) 6 interface, which is favorable for charges generation upon bias operation and facilitates the electron injection from the HOMO-tail region of α-NPD to the lowest unoccupied molecular orbital (LUMO) region of HAT(CN) 6 . [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15661199
Volume :
24
Database :
Academic Search Index
Journal :
Organic Electronics
Publication Type :
Academic Journal
Accession number :
103552943
Full Text :
https://doi.org/10.1016/j.orgel.2015.05.033