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Temperature Dependence of the Elastic Constants of Doped Silicon.

Authors :
Ng, Eldwin J.
Hong, Vu A.
Yang, Yushi
Ahn, Chae Hyuck
Everhart, Camille L. M.
Kenny, Thomas W.
Source :
Journal of Microelectromechanical Systems. Jun2015, Vol. 24 Issue 3, p730-741. 12p.
Publication Year :
2015

Abstract

Resonators fabricated in heavily doped silicon have been noted to have a reduced frequency-temperature dependence compared with lightly doped silicon. The resonant frequency of silicon microelectromechanical systems (MEMS) resonators is largely governed by the material’s elastic properties, which are known to depend on doping. In this paper, a suite of different types and orientations of resonators were used to extract the first- and second-order temperature dependences of the elastic constants of p-doped silicon up to 1.7e20 \mathrmcm^\mathrm \mathbf -3 , and n-doped up to 6.6e19 \mathrmcm^\mathrm \mathbf -3 . It is shown that these temperature-dependent elastic constants may be used in finite element analysis to predict the frequency-temperature dependence of similarly doped silicon resonators. [2013-0331] [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10577157
Volume :
24
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Microelectromechanical Systems
Publication Type :
Academic Journal
Accession number :
103129460
Full Text :
https://doi.org/10.1109/JMEMS.2014.2347205