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Growth and characterization of Al xGa1− xN lateral polarity structures.
- Source :
-
Physica Status Solidi. A: Applications & Materials Science . May2015, Vol. 212 Issue 5, p1039-1042. 4p. - Publication Year :
- 2015
-
Abstract
- AlGaN lateral polarity structures (LPS) with varying Al composition, have been fabricated by metalorganic chemical vapour deposition on LPS templates containing µm size domains. III-metal and N-polar AlGaN domains have been grown on LT-AlN and c-sapphire domains, respectively. LPS characterization by SEM and AFM reveals two major effects when the Al composition has been varied: (a) A high Al content leads to columnar growth within N-polar domains and (b) a height difference between the polar domains can be observed for low Al compositions towards III-polarity. The surface quality of the III-polar domains is not effected by the Al composition. The surface roughness of N-polar domains decreases for lower Al compositions. The high periodicity of the polar domains and the high quality of the boundary between domains suggest a high potential of AlGaN LPS to be used as lateral wave guides for quasi phase matching. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ALUMINUM compounds
*SAPPHIRES
*WAVEGUIDES
*SEMICONDUCTORS
*PHOTOLITHOGRAPHY
Subjects
Details
- Language :
- English
- ISSN :
- 18626300
- Volume :
- 212
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Physica Status Solidi. A: Applications & Materials Science
- Publication Type :
- Academic Journal
- Accession number :
- 102602508
- Full Text :
- https://doi.org/10.1002/pssa.201431740