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Development of a DAQ system for a plasma display panel-based X-ray detector (PXD).
- Source :
-
Nuclear Instruments & Methods in Physics Research Section A . Jun2015, Vol. 784, p213-219. 7p. - Publication Year :
- 2015
-
Abstract
- Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme—the line-scan method—is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively. [ABSTRACT FROM AUTHOR]
- Subjects :
- *X-ray detection
*PLASMA displays
*ACQUISITION of data
*PIXELS
*ELECTRIC potential
Subjects
Details
- Language :
- English
- ISSN :
- 01689002
- Volume :
- 784
- Database :
- Academic Search Index
- Journal :
- Nuclear Instruments & Methods in Physics Research Section A
- Publication Type :
- Academic Journal
- Accession number :
- 102217955
- Full Text :
- https://doi.org/10.1016/j.nima.2014.11.043