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NEMS by Sidewall Transfer Lithography.

Authors :
Dixi Liu
Syms, Richard R. A.
Source :
Journal of Microelectromechanical Systems. Dec2014, Vol. 23 Issue 6, p1366-1373. 8p.
Publication Year :
2014

Abstract

A batch fabrication process for nanoelectromechanical systems (NEMS) based on sidewall transfer lithography (STL) is demonstrated. The STL is used to form nanoscale flexible silicon suspensions entirely by conventional photolithography. A two-step process for combining microscale and nanoscale features is used to fabricate double-ended and single-ended electrothermal actuators with a minimum feature width of 100 nm and an aspect ratio of 40:1. All devices are fabricated by deep reactive ion etching in 4.5-μm-thick silicon using bonded silicon-on-insulator material. The process could allow low cost fabrication of nanoscale sensors and actuators. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10577157
Volume :
23
Issue :
6
Database :
Academic Search Index
Journal :
Journal of Microelectromechanical Systems
Publication Type :
Academic Journal
Accession number :
101290636
Full Text :
https://doi.org/10.1109/JMEMS.2014.2313462