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NEMS by Sidewall Transfer Lithography.
- Source :
-
Journal of Microelectromechanical Systems . Dec2014, Vol. 23 Issue 6, p1366-1373. 8p. - Publication Year :
- 2014
-
Abstract
- A batch fabrication process for nanoelectromechanical systems (NEMS) based on sidewall transfer lithography (STL) is demonstrated. The STL is used to form nanoscale flexible silicon suspensions entirely by conventional photolithography. A two-step process for combining microscale and nanoscale features is used to fabricate double-ended and single-ended electrothermal actuators with a minimum feature width of 100 nm and an aspect ratio of 40:1. All devices are fabricated by deep reactive ion etching in 4.5-μm-thick silicon using bonded silicon-on-insulator material. The process could allow low cost fabrication of nanoscale sensors and actuators. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10577157
- Volume :
- 23
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Journal of Microelectromechanical Systems
- Publication Type :
- Academic Journal
- Accession number :
- 101290636
- Full Text :
- https://doi.org/10.1109/JMEMS.2014.2313462