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Fabrication and Characterization of a Vacuum Encapsulated Curved Beam Switch for Harsh Environment Application.
- Source :
-
Journal of Microelectromechanical Systems . Oct2014, Vol. 23 Issue 5, p1121-1130. 10p. - Publication Year :
- 2014
-
Abstract
- A vacuum-encapsulated silicon switch with a curved electrode is characterized for operation in harsh environments. An ultraclean vacuum encapsulation process (episeal) seals the switch after release, providing a pristine operating environment for switching operations. In these devices, the curved beam of the actuator enhances the overdrive voltage tolerance to be more than 100 V. The ON/OFF cycle tests were carried out up to 105 cycles at room temperature, and at least 104 cycles under an elevated temperature of 300°C. Throughout the 300°C tests, an average contact resistance of ~ 28 kΩ is measured, demonstrating the stability of the contact. Finally, high speed pulse I-V monitoring unit was used to observe 13-μs switching speed. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10577157
- Volume :
- 23
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Microelectromechanical Systems
- Publication Type :
- Academic Journal
- Accession number :
- 101290611
- Full Text :
- https://doi.org/10.1109/JMEMS.2014.2305754