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The role of the hole-extraction layer in determining the operational stability of a polycarbazole:fullerene bulk-heterojunction photovoltaic device.

Authors :
Bovill, E.
Scarratt, N.
Griffin, J.
Yi, H.
Iraqi, A.
Buckley, A. R.
Kingsley, J. W.
Lidzey, D. G.
Source :
Applied Physics Letters. 2/16/2015, Vol. 106 Issue 8, p1-5. 5p. 2 Charts, 3 Graphs.
Publication Year :
2015

Abstract

We have made a comparative study of the relative operational stability of bulk-heterojunction organic photovoltaic (OPV) devices utilising different hole transport layers (HTLs). OPV devices were fabricated based on a blend of the polymer PCDTBT with the fullerene PC70BM, and incorporated the different HTL materials PEDOT:PSS, MoOx and V2O5. Following 620 h of irradiation by light from a solar simulator, we find that devices using the PEDOT:PSS HTL retained the highest efficiency, having a projected T80 lifetime of 14500 h. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
106
Issue :
8
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
101136969
Full Text :
https://doi.org/10.1063/1.4909530