Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers.

MLA

Grant, N. E., et al. “Grown-in Defects Limiting the Bulk Lifetime of p-Type Float-Zone Silicon Wafers.” Journal of Applied Physics, vol. 117, no. 5, Feb. 2015, pp. 055711-1-055711-8. EBSCOhost, https://doi.org/10.1063/1.4907804.

APA

Grant, N. E., Rougieux, F. E., Macdonald, D., Bullock, J., & Wan, Y. (2015). Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers. Journal of Applied Physics, 117(5), 055711-1-055711-8. https://doi.org/10.1063/1.4907804

Chicago

Grant, N. E., F. E. Rougieux, D. Macdonald, J. Bullock, and Y. Wan. 2015. “Grown-in Defects Limiting the Bulk Lifetime of p-Type Float-Zone Silicon Wafers.” Journal of Applied Physics 117 (5): 055711-1-055711-8. doi:10.1063/1.4907804.