High-resolution dichroic imaging of magnetic flux distributions in superconductors with scanning x-ray microscopy.

The penetration of magnetic flux into high-temperature superconductors has been observed using a high-resolution technique based on x-ray magnetic circular dichroism. Superconductors coated with thin soft-magnetic layers are observed in a scanning x-ray microscope under the influence of external magnetic fields. Resulting electric currents in the superconductor create an inhomogeneous magnetic field distribution above the superconductor and lead to a local reorientation of the ferromagnetic layer. Measuring the local magnetization of the ferromagnet by x-ray absorption microscopy with circular-polarized radiation allows the analysis of the magnetic flux distribution in the superconductor with a spatial resolution on the nanoscale. [ABSTRACT FROM AUTHOR]