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Element-specific magnetic properties of Co2MnSi thin films.
- Source :
-
Journal of Applied Physics . 5/15/2005, Vol. 97 Issue 10, p10C302-1-10C302-3. 3p. 4 Graphs. - Publication Year :
- 2005
-
Abstract
- Co2MnSi thin films were grown on Al2O3 sa planed and GaAs (001) substrates and on thin silicon nitride windows using pulsed laser deposition. Angle-dependent magneto-optic Kerr effect measurements reveal both a uniaxial and a fourfold magnetocrystalline anisotropy for films grown on GaAs (001). X-ray magnetic circular dichroism spectra were measured at the L2,3 edges of the thin films as a function of aluminum cap layer thickness, and transmission mode L2,3 x-ray absorption through a 1000-Å Co2MnSi film grown on a silicon nitride membrane were measured, indicating that deviations from metalliclike spectra are likely due oxidation or contamination. Element-specific moments for Co and Mn were calculated from the X-ray magnetic circular dichroism data of a nonoxidized film. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 97
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 100455054
- Full Text :
- https://doi.org/10.1063/1.1847391