Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Mu ltifreq uency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction.

MLA

Bobbitt, Jonathan M., et al. “Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Mu Ltifreq Uency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction.” Analytical Chemistry, vol. 86, no. 24, Dec. 2014, pp. 11957–61. EBSCOhost, https://doi.org/10.1021/ac504103g.

APA

Bobbitt, J. M., Weibel, S. C., Elshobaki, M., Chaudhary, S., & Smith, E. A. (2014). Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Mu ltifreq uency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction. Analytical Chemistry, 86(24), 11957–11961. https://doi.org/10.1021/ac504103g

Chicago

Bobbitt, Jonathan M., Stephen C. Weibel, Moneim Elshobaki, Sumit Chaudhary, and Emily A. Smith. 2014. “Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Mu Ltifreq Uency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction.” Analytical Chemistry 86 (24): 11957–61. doi:10.1021/ac504103g.