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At the University of Twente a U-shaped spring has been used to investigate the mechanical properties of a large variety of superconducting tapes and wires. Several mechanisms are responsible for the degradation of critical current as a function of applied strain. A change in its intrinsic parameters causes a reversible critical current dependence in Nb3Sn. The critical current reaches a maximum at a wire-dependent tensile strain level, and decreases when this tensile strain is either released or further increased. In Bi-based tapes the critical current is virtually insensitive to tensile strain up to a sample-dependent irreversible strain limit. When this limit is exceeded, the critical current decreases steeply and irreversibly. This behaviour is attributed to microstructural damage to the filaments. This cracking of the filaments is verified by a magneto-optical strain experiment. Recent experiments suggest that in MgB2 the degradation of critical current is caused by a change in intrinsic properties and damage to the microstructure. Magneto-optical imaging can be used to investigate the influence of applied strain on the microstructure of MgB2, as is done successfully with Bi-based tapes. In all these conductors the thermal precompression of the filaments plays an important role. In Nb3Sn it determines the position of the maximum and in Bi-based and MgB2 conductors it is closely related to the irreversible strain limit.

In order to determine the influence of intermediate deformation steps on the mechanical behavior of Bi-based tapes, the effect of longitudinal applied strain is investigated by means of magneto-optical imaging. The strain is applied in a helium flow-cryostat. Cracks appear soon after the critical current in Bi-based tapes is degraded. All filaments form multiple cracks that grow into tape-wide cracks, running from one filament to the next. The crack location is not caused by stress concentrations in the matrix, but by the mechanically weak colony boundaries. Because of the absence of intermediate rolling steps in the production of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tapes, a different crack structure is observed compared to Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ tapes. The relation between the critical current and the formation of cracks is studied. The degradation in critical current before the critical strain is reached may be caused by microcracks that remain undetected by magneto-optical imaging. The influence of strain on the microstructure of YBa/sub 2/Cu/sub 3/O/sub x/ coated conductors is also investigated with magneto-optical imaging. The formation of cracks is believed to be determined by the nickel substrate and related to the Ni-grain size.

An extensive overview of a model that describes current flow and dissipation in high-quality Bi2Sr2Ca2Cu3Ox superconducting tapes is provided. The parallel path model is based on a superconducting current running in two distinct parallel paths. One of the current paths is formed by grains that are connected at angles below 4 degrees. Dissipation in this strongly linked backbone occurs within the grains and is well described by classical flux-creep theory. The other current path, the weakly linked network, is formed by superconducting grains that are connected at intermediate angles (4 degrees-8 degrees) where dissipation occurs at the grain boundaries. However, grain boundary dissipation in this weakly linked current path does not occur through Josephson weak links, but just as in the strongly linked backbone, is well described by classical flux creep. The results of several experiments on Bi2Sr2Ca2Cu3Ox tapes and single-grained powders that strongly support the parallel path model are presented. The critical current density of Bi2Sr2Ca2Cu3Ox tapes can be scaled as a function of magnetic field angle over the temperature range from 15 K to 77 K. Expressions based on classical flux creep are introduced to describe the dependence of the critical current density of Bi2Sr2Ca2Cu3Ox tapes on the magnetic field and temperature.

The crack formation in filaments of multi-filamentary Bi2Sr2Ca2Cu3Ox tapes as function of applied longitudinal strain is visualized by means of magneto-optical imaging. Strain is applied at the desired temperature inside a helium flow cryostat. Cracks form transverse to the current carrying direction of the filaments. Before the tape breaks entirely, all filaments have formed a large number of transverse cracks, spaced with an average crack distance of ≈200 μm. The crack formation is compared with the degradation of the critical current as a function of the applied strain. The critical current degrades already before the first crack is observed. This is explained by the limited number of filaments visible in the experiment.

To better understand the dominant mechanisms that limit the critical current density in high temperature superconductors, the dependence of the critical current density on magnetic field and temperature of Bi2Sr2Ca2Cu3Ox tapes is measured in magnetic fields up to 8 T and temperatures between 4.2 and 100 K. The results were modeled by describing the current in the tape as two parallel current paths. The critical current density of one path is limited by weak links and that of the other path by intragranular flux pinning. The temperature dependence of the parameters used in the model indicates that the weak link contribution vanishes at a temperature of 86 K. This is an indication that the weak link behavior is dominated by a remnant Bi2Sr2CaCu2Ox phase. At higher temperatures the critical current density of the tape is limited by intragranular pinning.