1. Exploring the potential of deep learning and machine learning techniques for randomness analysis to enhance security on IoT.
- Author
-
Ince, Kenan
- Subjects
- *
DEEP learning , *MACHINE learning , *INTERNET of things , *PROCESS capability , *BINARY sequences , *EDGE computing - Abstract
The Internet of Things (IoT) is an incredibly growing technology. However, due to hardware inadequacy, IoT security is not improving to the same extent. For this reason, lightweight encryption algorithms have begun to be developed. This paper presents a method for assessing the security of Pseudorandom Number Generator (PRNG) generated binary sequences in a reasonable time using a pre-trained deep learning (DL) model. Due to their long execution times, Randomness Test Standards (RTSs) that include statistical tests that examine whether the sequences generated by PRNGs contain any patterns that cause cryptographic vulnerabilities are not suitable for running on edge devices with low processing capacities such as the IoT. We argue that every random sequence, even generated by a PRNGs that are classified as cryptographically secure, utilized in cryptographic applications should be used after successful results obtained from RTSs in every time. Therefore, an alternative method based on machine learning has been proposed to overcome the processing time problem of these test suites. The most utilized RTSs are NIST 800-22 Rev.1a, GB/T 32915-2016 and AIS 20/31. The 800-22 Rev.1a, which NIST has designated as a standard, has been observed to be the most referenced test standard in the literature. With this implementation, we sought to show that 15 statistical tests of the NIST 800-22 rev.1a environment can be modeled using DL. The application findings indicate that this modeling can serve as an alternative to the existing test environments. The average accuracy recorded throughout 15 tests was 98.64 percent. As a result, the trained model can be implemented even in edge computing devices with limited capability including IoTs. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF