Search

We introduce ssc-cdi, an open-source software package from the Sirius Scientific Computing family, designed for memory-efficient, single-node multi-GPU ptychography reconstruction. ssc-cdi offers a range of reconstruction engines in Python version 3.9.2 and C++/CUDA. It aims at developing local expertise and customized solutions to meet the specific needs of beamlines and user community of the Brazilian Synchrotron Light Laboratory (LNLS). We demonstrate ptychographic reconstruction of beamline data and present benchmarks for the package. Results show that ssc-cdi effectively handles extreme datasets typical of modern X-ray facilities without significantly compromising performance, offering a complementary approach to well-established packages of the community and serving as a robust tool for high-resolution imaging applications. [ABSTRACT FROM AUTHOR]

Advances in physics have been significantly driven by state-of-the-art technology, and in photonics and X-ray science this calls for the ability to manipulate the characteristics of optical beams. Orbital angular momentum (OAM) beams hold substantial promise in various domains such as ultra-high-capacity optical communication, rotating body detection, optical tweezers, laser processing, super-resolution imaging etc. Hence, the advancement of OAM beam-generation technology and the enhancement of its technical proficiency and characterization capabilities are of paramount importance. These endeavours will not only facilitate the use of OAM beams in the aforementioned sectors but also extend the scope of applications in diverse fields related to OAM beams. At the FERMI Free-Electron Laser (Trieste, Italy), OAM beams are generated either by tailoring the emission process on the undulator side or, in most cases, by coupling a spiral zone plate (SZP) in tandem with the refocusing Kirkpatrick–Baez active optic system (KAOS). To provide a robust and reproducible workflow to users, a Hartmann wavefront sensor (WFS) is used for both optics tuning and beam characterization. KAOS is capable of delivering both tightly focused and broad spots, with independent control over vertical and horizontal magnification. This study explores a novel non-conventional `near collimation' operational mode aimed at generating beams with OAM that employs the use of a lithographically manufactured SZP to achieve this goal. The article evaluates the mirror's performance through Hartmann wavefront sensing, offers a discussion of data analysis methodologies, and provides a quantitative analysis of these results with ptychographic reconstructions.

The development of hard X-ray nanoprobe techniques has given rise to a number of experimental methods, like nano-XAS, nano-XRD, nano-XRF, ptychography and tomography. Each method has its own unique data processing algorithms. With the increase in data acquisition rate, the large amount of generated data is now a big challenge to these algorithms. In this work, an intuitive, user-friendly software system is introduced to integrate and manage these algorithms; by taking advantage of the loosely coupled, component-based design approach of the system, the data processing speed of the imaging algorithm is enhanced through optimization of the parallelism efficiency. This study provides meaningful solutions to tackle complexity challenges faced in synchrotron data processing.

Advances in physics have been significantly driven by state‐of‐the‐art technology, and in photonics and X‐ray science this calls for the ability to manipulate the characteristics of optical beams. Orbital angular momentum (OAM) beams hold substantial promise in various domains such as ultra‐high‐capacity optical communication, rotating body detection, optical tweezers, laser processing, super‐resolution imaging etc. Hence, the advancement of OAM beam‐generation technology and the enhancement of its technical proficiency and characterization capabilities are of paramount importance. These endeavours will not only facilitate the use of OAM beams in the aforementioned sectors but also extend the scope of applications in diverse fields related to OAM beams. At the FERMI Free‐Electron Laser (Trieste, Italy), OAM beams are generated either by tailoring the emission process on the undulator side or, in most cases, by coupling a spiral zone plate (SZP) in tandem with the refocusing Kirkpatrick–Baez active optic system (KAOS). To provide a robust and reproducible workflow to users, a Hartmann wavefront sensor (WFS) is used for both optics tuning and beam characterization. KAOS is capable of delivering both tightly focused and broad spots, with independent control over vertical and horizontal magnification. This study explores a novel non‐conventional 'near collimation' operational mode aimed at generating beams with OAM that employs the use of a lithographically manufactured SZP to achieve this goal. The article evaluates the mirror's performance through Hartmann wavefront sensing, offers a discussion of data analysis methodologies, and provides a quantitative analysis of these results with ptychographic reconstructions. [ABSTRACT FROM AUTHOR]

The development of hard X‐ray nanoprobe techniques has given rise to a number of experimental methods, like nano‐XAS, nano‐XRD, nano‐XRF, ptychography and tomography. Each method has its own unique data processing algorithms. With the increase in data acquisition rate, the large amount of generated data is now a big challenge to these algorithms. In this work, an intuitive, user‐friendly software system is introduced to integrate and manage these algorithms; by taking advantage of the loosely coupled, component‐based design approach of the system, the data processing speed of the imaging algorithm is enhanced through optimization of the parallelism efficiency. This study provides meaningful solutions to tackle complexity challenges faced in synchrotron data processing. [ABSTRACT FROM AUTHOR]

Here we show that compressive sensing allows 4‐dimensional (4‐D) STEM data to be obtained and accurately reconstructed with both high‐speed and reduced electron fluence. The methodology needed to achieve these results compared to conventional 4‐D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and the lower fluence experimentally. We also consider downsampling of the detector, showing that oversampling is inherent within convergent beam electron diffraction (CBED) patterns and that detector downsampling does not reduce precision but allows faster experimental data acquisition. Analysis of an experimental atomic resolution yttrium silicide dataset shows that it is possible to recover over 25 dB peak signal‐to‐noise ratio in the recovered phase using 0.3% of the total data. Lay abstract: Four‐dimensional scanning transmission electron microscopy (4‐D STEM) is a powerful technique for characterizing complex nanoscale structures. In this method, a convergent beam electron diffraction pattern (CBED) is acquired at each probe location during the scan of the sample. This means that a 2‐dimensional signal is acquired at each 2‐D probe location, equating to a 4‐D dataset. Despite the recent development of fast direct electron detectors, some capable of 100kHz frame rates, the limiting factor for 4‐D STEM is acquisition times in the majority of cases, where cameras will typically operate on the order of 2kHz. This means that a raster scan containing 256^2 probe locations can take on the order of 30s, approximately 100‐1000 times longer than a conventional STEM imaging technique using monolithic radial detectors. As a result, 4‐D STEM acquisitions can be subject to adverse effects such as drift, beam damage, and sample contamination. Recent advances in computational imaging techniques for STEM have allowed for faster acquisition speeds by way of acquiring only a random subset of probe locations from the field of view. By doing this, the acquisition time is significantly reduced, in some cases by a factor of 10‐100 times. The acquired data is then processed to fill‐in or inpaint the missing data, taking advantage of the inherently low‐complex signals which can be linearly combined to recover the information. In this work, similar methods are demonstrated for the acquisition of 4‐D STEM data, where only a random subset of CBED patterns are acquired over the raster scan. We simulate the compressive sensing acquisition method for 4‐D STEM and present our findings for a variety of analysis techniques such as ptychography and differential phase contrast. Our results show that acquisition times can be significantly reduced on the order of 100‐300 times, therefore improving existing frame rates, as well as further reducing the electron fluence beyond just using a faster camera. [ABSTRACT FROM AUTHOR]

Recently, the demand for 3D microscopic observation of optically transparent biological cells and optical components with micro-sized structures has increased. This demand stems from the continuous development of bio-medical and precision machinery engineering. Various microscopic observation methods for phase objects, such as laser confocal fluorescence and phase contrast microscopy exist. However, these methods have some limitations. The former suffers from the problem of sample contamination by fluorescent staining, whereas the latter is faced with challenges in achieving quantitative measurements, particularly for thick samples. To address these issues, this study focuses on a common optical microscope with non-destructive, noncontact, and low-cost capabilities for both transmission and reflection observations. However, two critical problems arise during image acquisition using the common optical microscope. First, the resolution decreases owing to the diffraction limit of optics. Second, phase information is lost in the image acquired by an image sensor. Generally, a quantitative 3D measurement of the sample obtained by utilizing an optical microscope requires amplitude and phase information of light. Therefore, we propose ptychographic structured illumination microscopy (SIM). This is a combination of the SIM and ptychographic reconstruction of the phase information of light. It enables both super-resolution and phase retrieval in optical microscopic imaging. First, we designed a numerical model of the proposed ptychographic SIM and subsequently evaluated its performance through a series of numerical simulations. Next, we developed an experimental setup and successfully improved the resolution by approximately a factor of two approximately, while quantitatively recovering optical phase information as well. [ABSTRACT FROM AUTHOR]

Hard X‐rays are needed for non‐destructive nano‐imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest‐quality images with single‐digit nm resolution using advanced techniques such as X‐ray ptychography. However, the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an X‐ray multibeam ptychography (MBP) approach. This expands the domain of X‐ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenge of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, that challenge is overcome by creating a lens array using cutting‐edge laser printing technology and applying it to perform scanning with MBP with up to 12 beams and at photon energies of 13 and 20 keV. This exceeds the measurement limits of conventional hard X‐ray ptychography without compromising image quality for various samples: Siemens star test pattern, Ni/Al2O3 catalyst, microchip, and gold nano‐crystal clusters. [ABSTRACT FROM AUTHOR]

Ptychography is a computational imaging technique that aims to reconstruct the object of interest from a set of diffraction patterns. Each of these is obtained by a localized illumination of the object, which is shifted after each illumination to cover its whole domain. Because in the resulting measurements the phase information is lost, ptychography gives rise to solving a phase retrieval problem. In this work, we consider ptychographic measurements contaminated by a background signal. Such a background is caused by imperfections in the experimental setup and appears as a signal that is added to the diffraction patterns. The background is assumed to be independent of the shift of the object, i.e., it is the same for all diffraction patterns. Two algorithms are provided, for arbitrary objects and for so-called phase objects that do not absorb the light but only scatter it. For the second type, a uniqueness of reconstruction is established for almost every object. Our approach is based on the Wigner distribution deconvolution, which lifts the object to a higher-dimensional matrix space where the recovery can be reformulated as a linear problem. The background only affects a few equations of the linear system that are therefore discarded. The lost information is then restored using redundancy in the higher-dimensional space. [ABSTRACT FROM AUTHOR]

Over 50 years of development, synchrotron based X-ray microscopy has become a routine and powerful tool for the analysis of nanoscale structure and chemistry in many areas of science. Scanning X-ray microscopy is particularly well suited to the study of chemical and magnetic states of matter and has become available at most synchrotron light sources using a variety of optical schemes, detectors and sample environments. The Advanced Light Source at Lawrence Berkeley National Laboratory has an extensive program of soft X-ray scanning microscopy which supports a broad range of scientific research using a suite of advanced tools for high spatio-temporal resolution and control of active materials. Instruments operating within an energy range between 200–2500 eV with spatial resolution down to 7 nm and sub 20 picosecond time resolution are available. These capabilities can be routinely used in combination with a variety of sample stimuli, including gas or fluid flow, temperature control from 100 to 1200 K, DC bias and pulsed or continuous microwave excitation. We present here a complete survey of our instruments, their most advanced capabilities and a perspective on how they complement each other to solve complex problems in energy, materials and environmental science.

Ptychography today is considered the most natural and effective method for approaching the diffraction limit of optical resolution. The principal scheme of a ptychoscope does not contain refractive or focusing elements and includes a coherent light source, a platform for moving (macroscopic) object, and a detector for registering radiation passed through or reflected by the object associated with a computer for processing diffraction patterns. In classical optics, the main task in achieving high spatial resolution is the correction and elimination of aberrations of optical systems, while in ptychography spatial resolution mainly depends on the reliability of registration and computer processing of diffraction patterns with large numerical apertures. The key idea of ptychography is to obtain an image by computer processing of overlapping diffraction patterns (scans). When moving the object it is assumed that the illuminating beam and the position of the detector remain unchanged. Ptychography is used in a wide range of radiation wavelengths from infrared to X-ray, and it is possible to do without imaging optics. In this work, the possibility of obtaining an amplitude-phase image of the surface relief of an object inclined to the incident one was studied. [ABSTRACT FROM AUTHOR]

One of the tasks of modern optical methods is the most complete description of the objects under study and the wave fields. For example, properties of the materials under study should be characterized not only by absorption but also by refraction, and the wave fields behind the object and near the detector should be characterized not only by intensity but also by phase. The work of Gerchberg and Saxton in 1972 was the first attempt to accomplish this task without using any optical elements, relying only on a quadratic detector and a computer simulation of the propagation of electromagnetic waves. Today, similar lensless imaging methods are applied across a wide range of wavelengths—from terahertz to hard X-ray. The purpose of this paper is to provide a brief introduction to the theory of lensless methods as applied to the X-ray wavelength range. It also presents the results of recent experiments on lensless imaging of test objects conducted at the Lebedev Physical Institute using lasers. [ABSTRACT FROM AUTHOR]

Abstract Hard X‐rays are needed for non‐destructive nano‐imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest‐quality images with single‐digit nm resolution using advanced techniques such as X‐ray ptychography. However, the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an X‐ray multibeam ptychography (MBP) approach. This expands the domain of X‐ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenge of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, that challenge is overcome by creating a lens array using cutting‐edge laser printing technology and applying it to perform scanning with MBP with up to 12 beams and at photon energies of 13 and 20 keV. This exceeds the measurement limits of conventional hard X‐ray ptychography without compromising image quality for various samples: Siemens star test pattern, Ni/Al2O3 catalyst, microchip, and gold nano‐crystal clusters.

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal series of four-dimensional scanning transmission electron microscopy (4D-STEM) data. We apply the approach to a lead iridate, PbIrO, and yttrium-stabilized zirconia, YZrO, heterostructure from data acquired with the specimen in a single plan-view orientation, with the epitaxial layers stacked along the beam direction. We demonstrate that Pb-Ir atomic columns are visible in the uppermost layers of the reconstructed volume. We compare this approach to the alternative techniques of depth sectioning using differential phase contrast scanning transmission electron microscopy (DPC-STEM) and multislice ptychographic reconstruction.

Ptychography is an imaging technique that captures multiple overlapping snapshots of a sample, illuminated coherently by a moving localized probe. The image recovery from ptychographic data is generally achieved via an iterative algorithm that solves a nonlinear phase retrieval problem derived from measured diffraction patterns. However, these iterative approaches have high computational cost. In this paper, we introduce PtychoDV, a novel deep model-based network designed for efficient, high-quality ptychographic image reconstruction. PtychoDV comprises a vision transformer that generates an initial image from the set of raw measurements, taking into consideration their mutual correlations. This is followed by a deep unrolling network that refines the initial image using learnable convolutional priors and the ptychography measurement model. Experimental results on simulated data demonstrate that PtychoDV is capable of outperforming existing deep learning methods for this problem, and significantly reduces computational cost compared to iterative methodologies, while maintaining competitive performance.

We introduce ssc-cdi, an open-source software package from the Sirius Scientific Computing family, designed for memory-efficient, single-node multi-GPU ptychography reconstruction. ssc-cdi offers a range of reconstruction engines in Python version 3.9.2 and C++/CUDA. It aims at developing local expertise and customized solutions to meet the specific needs of beamlines and user community of the Brazilian Synchrotron Light Laboratory (LNLS). We demonstrate ptychographic reconstruction of beamline data and present benchmarks for the package. Results show that ssc-cdi effectively handles extreme datasets typical of modern X-ray facilities without significantly compromising performance, offering a complementary approach to well-established packages of the community and serving as a robust tool for high-resolution imaging applications.

Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. A full conceptual design of a 1 nm (1.24 keV) UCXFEL with a length and cost over an order of magnitude below current X-ray free-electron lasers (XFELs) has resulted from this effort. This instrument has been developed with an emphasis on permitting exploratory scientific research in a wide variety of fields in a university setting. Concurrently, compact FELs are being vigorously developed for use as instruments to enable next-generation chip manufacturing through use as a high-flux, few nm lithography source. This new role suggests consideration of XFELs to urgently address emerging demands in the semiconductor device sector, as identified by recent national need studies, for new radiation sources aimed at chip manufacturing. Indeed, it has been shown that one may use coherent X-rays to perform 10–20 nm class resolution surveys of macroscopic, cm scale structures such as chips, using ptychographic laminography techniques. As the XFEL is a very promising candidate for realizing such methods, we present here an analysis of the issues and likely solutions associated with extending the UCXFEL to harder X-rays (above 7 keV), much higher fluxes, and increased levels of coherence, as well as methods of applying such a source for ptychographic laminography to microelectronic device measurements. We discuss the development path to move the concept to rapid realization of a transformative XFEL-based application, outlining both FEL and metrology system challenges. [ABSTRACT FROM AUTHOR]

Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and devices. Despite the widespread use of high-energy electrons for atomic-scale imaging, they have low sensitivity to spin textures. Typically, the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential. Here, we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography, paving the way for magnetic lattice imaging of antiferromagnetic materials and devices. [ABSTRACT FROM AUTHOR]

Small voids in the absorber layer of thin‐film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample‐preparation artifacts. Here, synchrotron imaging is performed on a fully operational as‐deposited solar cell containing a few tens of voids. By measuring operando current and X‐ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material‐deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance. [ABSTRACT FROM AUTHOR]

Abstract Small voids in the absorber layer of thin‐film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample‐preparation artifacts. Here, synchrotron imaging is performed on a fully operational as‐deposited solar cell containing a few tens of voids. By measuring operando current and X‐ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material‐deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.

Biominerals such as seashells, coral skeletons, bone, and tooth enamel are optically anisotropic crystalline materials with unique nanoscale and microscale organization that translates into exceptional macroscopic mechanical properties, providing inspiration for engineering new and superior biomimetic structures. Using Seriatopora aculeata coral skeleton as a model, here, we experimentally demonstrate X-ray linear dichroic ptychography and map the c-axis orientations of the aragonite (CaCO3) crystals. Linear dichroic phase imaging at the oxygen K-edge energy shows strong polarization-dependent contrast and reveals the presence of both narrow (35°) c-axis angular spread in the coral samples. These X-ray ptychography results are corroborated by four-dimensional (4D) scanning transmission electron microscopy (STEM) on the same samples. Evidence of co-oriented, but disconnected, corallite subdomains indicates jagged crystal boundaries consistent with formation by amorphous nanoparticle attachment. We expect that the combination of X-ray linear dichroic ptychography and 4D STEM could be an important multimodal tool to study nano-crystallites, interfaces, nucleation, and mineral growth of optically anisotropic materials at multiple length scales.

Ptychography is a lensless imaging technique, which considers reconstruction from a set of far-field diffraction patterns obtained by illuminating small overlapping regions of the specimen. In many cases, the distribution of light inside the illuminated region is unknown and has to be estimated along with the object of interest. This problem is referred to as blind ptychography. While in ptychography the illumination is commonly assumed to have a point spectrum, in this paper we consider an alternative scenario with a nontrivial light spectrum known as blind polychromatic ptychography. First, we show that nonblind polychromatic ptychography can be seen as a recovery from quadratic measurements. Then, a reconstruction from such measurements can be performed by a variant of the Amplitude Flow algorithm, which has guaranteed sublinear convergence to a critical point. Second, we address recovery from blind polychromatic ptychographic measurements by devising an alternating minimization version of Amplitude Flow and showing that it converges to a critical point at a sublinear rate. [ABSTRACT FROM AUTHOR]

Linear dichroism is an important tool to characterize the transmission matrix and determine the crystal or orbital orientation in a material. In order to achieve high-resolution mapping of transmission properties, the linear-dichroism scattering model in ptychographic imaging is introduced, and an efficient two-stage reconstruction algorithm is developed. Using the proposed algorithm on a uniaxial material, the dichroic transmission matrix can be recovered without an analyzer by using ptychography measurements with as few as three different polarization angles, with the help of an empty region to remove phase ambiguities.

Spectroscopic ptychography is a powerful technique to determine the chemical composition of a sample with high spatial resolution. In spectro-ptychography, a sample is rastered through a focused X-ray beam with varying photon energy so that a series of phaseless diffraction data are recorded. Each chemical component in the material under investigation has a characteristic absorption and phase contrast as a function of photon energy. Using a dictionary formed by the set of contrast functions of each energy for each chemical component, it is possible to obtain the chemical composition of the material from high-resolution multi-spectral images. This paper presents SPA (spectroscopic ptychography with alternating direction method of multipliers), a novel algorithm to iteratively solve the spectroscopic blind ptychography problem. First, a nonlinear spectro-ptychography model based on Poisson maximum likelihood is designed, and then the proposed method is constructed on the basis of fast iterative splitting operators. SPA can be used to retrieve spectral contrast when considering either a known or an incomplete (partially known) dictionary of reference spectra. By coupling the redundancy across different spectral measurements, the proposed algorithm can achieve higher reconstruction quality when compared with standard state-of-the-art two-step methods. It is demonstrated how SPA can recover accurate chemical maps from Poisson-noised measurements, and its enhanced robustness when reconstructing reduced-redundancy ptychography data using large scanning step sizes is shown.

Abstract Table-top extreme ultraviolet (EUV) microscopy offers unique opportunities for label-free investigation of biological samples. Here, we demonstrate ptychographic EUV imaging of two dried, unstained model specimens: germlings of a fungus (Aspergillus nidulans), and bacteria (Escherichia coli) cells at 13.5 nm wavelength. We find that the EUV spectral region, which to date has not received much attention for biological imaging, offers sufficient penetration depths for the identification of intracellular features. By implementing a position-correlated ptychography approach, we demonstrate a millimeter-squared field of view enabled by infrared illumination combined with sub-60 nm spatial resolution achieved with EUV illumination on selected regions of interest. The strong element contrast at 13.5 nm wavelength enables the identification of the nanoscale material composition inside the specimens. Our work will advance and facilitate EUV imaging applications and enable further possibilities in life science.

The interaction of a focused X-ray beam with a sample in a scanning probe experiment can provide a variety of information about the interaction volume. In many scanning probe experiments X-ray fluorescence (XRF) is supplemented with measurements of the transmitted or scattered intensity using a pixelated detector. The automated extraction of different signals from an area pixelated detector is described, in particular the methodology for extracting differential phase contrast (DPC) is demonstrated and different processing methods are compared across a range of samples. The phase shift of the transmitted X-ray beam by the sample, extracted from DPC, is also compared with ptychography measurements to provide a qualitative and quantitative comparison. While ptychography produces a superior image, DPC can offer a simple, flexible method for phase contrast imaging which can provide fast results and feedback during an experiment; furthermore, for many science problems, such as registration of XRF in a lighter matrix, DPC can provide sufficient information to meet the experimental aims. As the DPC technique is a quantitative measurement, it can be expanded to spectroscopic studies and a demonstration of DPC for spectro-microscopy measurements is presented. Where ptychography can separate the absorption and phase shifts by the sample, quantitative interpretation of a DPC image or spectro-microscopy signal can only be performed directly when absorption is negligible or where the absorption contribution is known and the contributions can be fitted.

The PERCIVAL detector is a CMOS imager designed for the soft X-ray regime at photon sources. Although still in its final development phase, it has recently seen its first user experiments: ptychography at a free-electron laser, holographic imaging at a storage ring and preliminary tests on X-ray photon correlation spectroscopy. The detector performed remarkably well in terms of spatial resolution achievable in the sample plane, owing to its small pixel size, large active area and very large dynamic range; but also in terms of its frame rate, which is significantly faster than traditional CCDs. In particular, it is the combination of these features which makes PERCIVAL an attractive option for soft X-ray science.

As a unique coherent diffraction imaging method, X-ray ptychography has an ultrahigh resolution of several nanometers for extended samples. However, ptychography is often degraded by various noises that are mixed with diffracted signals on the detector. Some of the noises can transform into periodic artifacts (PAs) in reconstructed images, which is a basic problem in raster-scan ptychography. Herein, we propose a novel periodic-artifact suppressing algorithm (PASA) and present a new understanding of PAs or raster-grid pathology generation mechanisms, which include static intensity (SI) as an important cause of PAs. The PASA employs a gradient descent scheme to iteratively separate the SI pattern from original datasets and a probe support constraint applied in the object update. Both simulative and experimental data reconstructions demonstrated the effectiveness of the new algorithm in suppressing PAs and improving ptychography resolution and indicated a better performance of the PASA method in PA removal compared to other mainstream algorithms. In the meantime, we provided a complete description of SI conception and its key role in PA generation. The present work enhances the feasibility of raster-scan ptychography and could inspire new thoughts for dealing with various noises in ptychography. [ABSTRACT FROM AUTHOR]

Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. A full conceptual design of a 1 nm (1.24 keV) UCXFEL with a length and cost over an order of magnitude below current X-ray free-electron lasers (XFELs) has resulted from this effort. This instrument has been developed with an emphasis on permitting exploratory scientific research in a wide variety of fields in a university setting. Concurrently, compact FELs are being vigorously developed for use as instruments to enable next-generation chip manufacturing through use as a high-flux, few nm lithography source. This new role suggests consideration of XFELs to urgently address emerging demands in the semiconductor device sector, as identified by recent national need studies, for new radiation sources aimed at chip manufacturing. Indeed, it has been shown that one may use coherent X-rays to perform 10–20 nm class resolution surveys of macroscopic, cm scale structures such as chips, using ptychographic laminography techniques. As the XFEL is a very promising candidate for realizing such methods, we present here an analysis of the issues and likely solutions associated with extending the UCXFEL to harder X-rays (above 7 keV), much higher fluxes, and increased levels of coherence, as well as methods of applying such a source for ptychographic laminography to microelectronic device measurements. We discuss the development path to move the concept to rapid realization of a transformative XFEL-based application, outlining both FEL and metrology system challenges.