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A system for quality assessment of micropixel detectors is presented. The system includes a laser scanning microprobe and a setup for studying the response of micro detectors to minimum ionizing particles. The results of the validation of the developed system indicate its suitability for assessing the quality of the latest monolithic active pixel sensors (MAPS), promising elements of large-area tracking systems for future high-energy physics experiments. Comparison of MAPS with the double-sided microstrip detectors of the CBM experiment (FAIR, Darmstadt) indicates the feasibility of the upgrade of its Silicon Tracking System using MAPS.

A system for quality assessment of micropixel detectors is presented. The system includes a laser scanning microprobe and a setup for studying the response of micro detectors to minimum ionizing particles. The results of the validation of the developed system indicate its suitability for assessing the quality of the latest monolithic active pixel sensors (MAPS), promising elements of large-area tracking systems for future high-energy physics experiments. Comparison of MAPS with the double-sided microstrip detectors of the CBM experiment (FAIR, Darmstadt) indicates the feasibility of the upgrade of its Silicon Tracking System using MAPS. [ABSTRACT FROM AUTHOR]