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20. Unveiling charge transport in monolayer and few-layer CoPS3/metal contact: Insight from C-AFM.

24. Comprehensive Study of NBTI and Off-State Reliabilty in Sub-20 nm DRAM Technology: Trap Identification, Compact Aging Model, and Impact on Retention Degradation

35. Deep Understanding of Reliability in Hf-based FeFET during Bipolar Pulse Cycling: Trap Profiling for Read-After-Write Delay and Memory Window Degradation

44. Abstract 1959: CDK9 inhibition combined with hypomethylating agents target MCL-1 dependency in MDS and AML

50. Investigation of Coercive Field Shift During Cycling in HfZrO ₓ Ferroelectric Capacitors.

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