107 results on '"Zhou, Kuan‐Ju"'
Search Results
2. Investigation of IGZO Thin Film Transistors with Copper Electrode Under Varied Channel Lengths and Different Gate Insulator Annealing Temperatures
3. Enhancing Reliability of Short-Channel Dual Gate InGaZnO Thin Film Transistors by Bottom-Gate Oxide Engineering
4. Improving Performance of FBARs by Advanced Low-Temperature High-Pressure Technology
5. Channel migration of dual channel a-InGaZnO TFTs under negative bias illumination stress
6. Abnormal Threshold Voltage Shift and Sub-channel Generation in Top-Gate InGaZnO TFTs under Backlight Negative Bias Illumination Stress
7. Impact of Variant Gate Insulator Fabrication Process on Reliability of Dual-Gate InGaZnO Thin-Film Transistors
8. Investigation between Recover Behavior and Defect with Variation of Light Source in AlGaN/GaN HEMTs after Hot-Carrier Stress
9. Interfacial Variation in HfO2-Based Resistive Switching Devices with Titanium Electrodes under Asymmetric Bias Operation
10. Abnormal Subthreshold Swing Decrease in a-InGaZnO Thin-Film Transistor After Self-Heating Stress
11. Forming-Free HfO2-Based Resistive Random Access Memory by X-Ray Irradiation
12. Abnormal Hump and Two-Step Degradation of Top Gate a-InGaZnO TFTs Under Positive Bias Stress
13. Investigation of the Self-Heating Effect in High Performance Organic TFTs With Multi-Finger Structure
14. A Stacked p‐Type Low‐Temperature Polycrystalline Silicon Thin‐Film Transistor for Future Display Applications
15. Physical Mechanism of the Mechanical Bending of High-Performance Organic TFTs and the Effect of Atmospheric Factors
16. Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs
17. Asymmetric Electrode Structure Induces Dual-Channel Phenomenon Under Hot-Carrier Stress in Organic Thin-Film Transistors
18. Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate
19. Suppressing Drain-Induced Barrier Lowering and Kink Effect in Low-Temperature Poly-Si TFTs Using a Partitioned Light Shield
20. Analysis of self-heating-related instability in n-channel low-temperature polysilicon TFTs with different S/D contact hole densities
21. Heterogeneous metal oxide channel structure for ultra-high sensitivity phototransistor with modulated operating conditions
22. Improving Drain-induced Barrier Lowing Effect and Hot Carrier Reliability with Terminal Via Structure on Half-Corbino Organic Thin-Film Transistors
23. Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design
24. Performance Enhancement of InGaZnO Top-Gate Thin Film Transistor With Low-Temperature High-Pressure Fluorine Treatment
25. Vertical Electric Field-Induced Abnormal Capacitance–Voltage Electrical Characteristics in a-InGaZnO TFTs
26. Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies
27. Obtaining impact ionization-induced hole current by electrical measurements in gallium nitride metal–insulator–semiconductor high electron mobility transistors
28. Realizing forming-free characteristic by doping Ag into HfO2-based RRAM
29. Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress and Illumination
30. Forming-Free HfO2-Based Resistive Random Access Memory by X-Ray Irradiation
31. Highly-Doped Region Optimization for Reduced Hot-Carrier Effects in Dual-Gate Low Temperature Polysilicon TFTs
32. Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature
33. Enhancing Hot-Carrier Reliability of Dual-Gate Low-Temperature Polysilicon TFTs by Increasing Lightly Doped Drain Length
34. Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress
35. Abnormal Hump Effect Induced by Hydrogen Diffusion During Self-Heating Stress in Top-Gate Amorphous InGaZnO TFTs
36. Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress
37. A Novel Structure to Reduce Degradation Under Mechanical Bending in Foldable Low Temperature Polysilicon TFTs Fabricated on Polyimide
38. Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors
39. Abnormal High Resistive State Current Mechanism Transformation in Ti/HfO2/TiN Resistive Random Access Memory
40. Enhancing LiAlOX synaptic performance by reducing the Schottky barrier height for deep neural network applications
41. Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs
42. Stabilizing resistive random access memory by constructing an oxygen reservoir with analyzed state distribution
43. Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs
44. Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors
45. Abnormal Back Channel Leakage Under Large Drain Voltage in Short Channel Organic Thin-Film Transistors
46. Investigation of the Capacitance–Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment
47. A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs
48. Improving Reliability of High-Performance Ultraviolet Sensor in a-InGaZnO Thin-Film Transistors
49. Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer
50. Realizing forming-free characteristic by doping Ag into HfO2-based RRAM.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.