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1. Time Dependent Dielectric Breakdown in 4H-SiC power MOSFETs under positive and negative gate-bias and gate-current stresses at 200{\deg}C

3. Nanoscale insights on the origin of the Power MOSFETs breakdown after extremely long high temperature reverse bias stress

4. Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress

11. Demographic, clinical, and service-use characteristics related to the clinician’s recommendation to transition from child to adult mental health services

12. Performance comparison of quadratic, nonlinear, and mixed integer nonlinear MPC formulations and solvers on an air source heat pump hydronic floor heating system

15. From an ellipsoid-based to an anthropomorphic articulated total body model for multibody applications

18. EP16.03-042 BET Inhibitors Stimulate NK Cytotoxic Activity in NSCLC through Attenuation of YAP/TAZ and SMAD3 Transcriptional Programs

21. Sequential coupled numerical simulations of an air/ground-source heat pump: Validation of the model and results of yearly simulations

27. Genetic variation and population structure of Italian native sheep breeds undergoing in situ conservation

29. Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects

46. A Point Prevalence Study of Delirium in Italian Nursing Homes

47. Silicon Carbide: Defects and Devices

50. Waiting times for diagnosis of attention-deficit hyperactivity disorder in children and adolescents referred to Italian ADHD centers must be reduced

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