46 results on '"Yang, Ling-Wu"'
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2. PMOS junction optimization for 3D NAND FLASH memory with CMOS under array
3. Improvement of cell reliability by floating gate implantation on 1Xnm NAND flash memory
4. Properties of N-rich Silicon Nitride Film Deposited by Plasma-Enhanced Atomic Layer Deposition
5. [Effect of Bone Marrow Mesenchymal Stem Cells on Mechanical Dynamics and BALP/CTX-1 Expression in Rats with Osteoporotic Vertebral Fracture]
6. Study of charge trapping characteristics of SONOS with various trapping layers using gate-sensing and channel-sensing (GSCS) method
7. Improvement of Multi-Lines Bridge Defect Classification by Hierarchical Architecture in Artificial Intelligence Automatic Defect Classification
8. CMP Process Optimization Engineering by Machine Learning
9. Improvement of Multi-lines bridge Defect Classification by Hierarchical Architecture in Artificial Intelligence Automatic Defect Classification
10. Process Optimization of Contact Module in NOR Flash Using High Resolution e-Beam Inspection
11. Verification of Systematic Defects Using e-Beam Defect Review System
12. Investigation of Floating Gate Implantation Effect on 1Xnm NAND FLASH
13. Thermal Stability of Cobalt Silicide on Polysilicon Implanted with Germanium
14. The new methodology of contact process window vericification
15. Systematic Hot Spots Finding By Pattern Search with Similarity
16. Advanced high accuracy scanning electron microscopy review methodology by virtual defect — Yiting Kuo.
17. Advanced process control of effective field height in a single wafer spin cleaning tool.
18. Dark field inspection technique on poly-silicon CMP process
19. The application of e beam inspection on 3D NAND flash
20. Sensitivities improvement by utilizing dark mode of bright filed inspection
21. FOUP environment control and condense reduction
22. Optics selection by high magnification optical micrograph in bright field inspection
23. Process Variation Improvement and Stress Analysis of Contact Module
24. Advanced Inspection Technique for High Aspect Ratio Contact Holes Using e Beam Scan and Voltage Cap in SEM Review
25. Robust shallow trench isolation technique used for 75nm nor flash memory
26. Yield enhancement using source/drain BF2+ implant process optimization
27. A highly scalable 8-layer 3D vertical-gate (VG) TFT NAND Flash using junction-free buried channel BE-SONOS device
28. Performance and reliability optimizations of BE-SONOS NAND Flash using SiON bandgap-tuning tunneling barrier
29. A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface
30. Physical and electrical characteristics of silicon oxynitride films with various refractive indices
31. Study of the charge-trapping characteristics of silicon-rich nitride thin films using the gate-sensing and channel-sensing (GSCS) method
32. Reliability and Processing Effects of Bandgap-Engineered SONOS (BE-SONOS) Flash Memory and Study of the Gate-Stack Scaling Capability
33. A Study of Sub-40nm FinFET BE-SONOS NAND Flash
34. A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET
35. A Novel Gate-Injection Program/Erase P-Channel NAND-Type Flash Memory with High (10M Cycle) Endurance
36. Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory
37. Study of Local Trapping and STI Edge Effects on Charge-Trapping NAND Flash
38. A Multi-Layer Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory
39. Reliability Model of Bandgap Engineered SONOS (BE-SONOS)
40. Effect of fabrication process on the charge trapping behavior of SiON thin films
41. Inspection sensitivity improvement by wafer sort failure sites matching algorithm — Chimin Chen.
42. 3D interconnect simulation applied to CMP thickness variations.
43. FOUP mini-environment contaminants analysis in semiconductor manufacturing.
44. Smart Review Sampling Methodology in Huge Inspection Results
45. Process Optimization of Contact Module in NOR Flash Using High Resolution e-Beam Inspection
46. Verification of Systematic Defects Using e-Beam Defect Review System
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