1. Advances in photoemission spectroscopy of f-electron materials
- Author
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Z. Fisk, Paul C. Canfield, Bo Wha Lee, M. B. Maple, Gey-Hong Gweon, J. W. Allen, C. G. Olson, Jonathan D. Denlinger, P. E. Armstrong, and Y. Dalichaouch
- Subjects
Physics ,X-ray spectroscopy ,Condensed matter physics ,Photoemission spectroscopy ,Inverse photoemission spectroscopy ,Angle-resolved photoemission spectroscopy ,Photon energy ,Condensed Matter Physics ,Electron spectroscopy ,Electronic, Optical and Magnetic Materials ,X-ray photoelectron spectroscopy ,Condensed Matter::Strongly Correlated Electrons ,Electrical and Electronic Engineering ,Atomic physics ,Spectroscopy - Abstract
The recent capability to perform angle-resolved photoemission spectroscopy (ARPES) with improved energy and angle resolution over a wide photon energy range has provided new information about f-electron systems. Results for two rather different systems, 5f-electron heavy fermion metal URu2Si2 and 4f-electron mixed-valent SmB6 are compared and contrasted.
- Published
- 2000
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