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8. Biaxial and uniaxial strain effects on the ultraviolet emission efficiencies of AlxGa1-xN films with different Al concentrations.

9. Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction.

14. Composition of SiC layer grown on Si(111) substrate analyzed by plan-view energy dispersive spectroscopy

28. Erratum: “Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction” [J. Appl. Phys. 103, 023504, (2008)]

30. Anisotropic crystallographic properties, strain, and their effects on band structure of m-plane GaN on LiAlO2(100)

34. Nonpolar m-plane thin film GaN and InGaN∕GaN light-emitting diodes on LiAlO2(100) substrates

43. Impact of effective shear strain on the equilibrium phases and polarization states of PbTiO3 thin film.

44. Polarization and temperature dependence of photoluminescence of m-plane GaN grown on γ-LiAlO2 (100) substrate.

45. Anisotropic crystallographic properties, strain, and their effects on band structure of m-plane GaN on LiAlO2(100).

46. Impact of lattice strain on the phase formation, polarization, and dielectric constant of PbZr1-xTixO3 films.

47. Nonpolar m-plane thin film GaN and InGaN/GaN light-emitting diodes on LiAlO2(100) substrates.

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