Search

The visual inspection algorithms are the core of automatic optical inspection system on surface mounting machines. This article is concerned with the development of precise positioning algorithms for circular mark points and transistor (TR) components on surface mounting devices. To handle nonuniform illumination or occlusion of other components, a polar coordinate transform and smoothness selection based circular mark point location method is proposed. The TR components are fundamental chips in electronic products and have various package types. The illumination changes, background disturbance, and the diversity of package types have imposed great challenges on the development of the uniform algorithm for detection and location of TR components. To deal with these issues, the 1-D integral image based TR component detection and location algorithm is proposed and the coordinates and orientation of the component are calculated simultaneously. The efficiency of the proposed methods is tested on real images and compared with classical Hough transform method, commercial algorithms on SMT482 device, and two methods of Halcon software.