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3. Multiscale analyses and characterizations of surface topographies

Author

Johan Berglund, François Blateyron, Gaëtan Le Goïc, Mary Kathryn Thompson, Peter S. Ungar, Xiang Jane Jiang, Nicola Senin, Yann Quinsat, Hans Nørgaard Hansen, E. Hassan Zahouani, W. James Stemp, Barnali M. Dixon, Tomasz Bartkowiak, Christopher A. Brown, Worcester Polytechnic Institute, Technical University of Denmark [Lyngby] (DTU), University of Huddersfield, Digital Surf, Swerea IVF, entreprise suédoise, Chalmers University of Technology [Göteborg], University of Nottingham, UK (UON), Università degli Studi di Perugia (UNIPG), Poznan University of Technology (PUT), University of South Florida [Tampa] (USF), Laboratoire d'Electronique, d'Informatique et d'Image [EA 7508] (Le2i), Université de Technologie de Belfort-Montbeliard (UTBM)-Université de Bourgogne (UB)-École Nationale Supérieure d'Arts et Métiers (ENSAM), Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM)-Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM)-AgroSup Dijon - Institut National Supérieur des Sciences Agronomiques, de l'Alimentation et de l'Environnement-Centre National de la Recherche Scientifique (CNRS), Laboratoire Universitaire de Recherche en Production Automatisée (LURPA), École normale supérieure - Cachan (ENS Cachan)-Université Paris-Sud - Paris 11 (UP11), Keene State College, General Electric, GE Aircraft Engines, Department of Anthropology [University of Arkansas], University of Arkansas [Fayetteville], Laboratoire de Tribologie et Dynamique des Systèmes (LTDS), École Centrale de Lyon (ECL), and Université de Lyon-Université de Lyon-École Nationale des Travaux Publics de l'État (ENTPE)-Ecole Nationale d'Ingénieurs de Saint Etienne-Centre National de la Recherche Scientifique (CNRS)

Subjects
Surface (mathematics), 0209 industrial biotechnology, Computed-Tomography, Computer science, Area Structure-Function, Computed tomography, 02 engineering and technology, Wavelet Transform, computer.software_genre, Metrology, Industrial and Manufacturing Engineering, [SPI]Engineering Sciences [physics], 020901 industrial engineering & automation, medicine, Production engineering, Dimensional Metrology, Quantitative-Analysis, Physics::Atmospheric and Oceanic Physics, medicine.diagnostic_test, Rough Surfaces, Mechanical Engineering, Fractal Analysis, 021001 nanoscience & nanotechnology, Engineering Surfaces, Fractal analysis, Roughness, Surface, Data mining, Ubm Laser Profilometry, 0210 nano-technology, Dental Microwear Texture, computer
Abstract

International audience; This work studies multiscale analyses and characterizations of surface topographies from the engineering and scientific literature with an emphasis on production engineering research and design. It highlights methods that provide strong correlations between topographies and performance or topographies and processes, and methods that can confidently discriminate topographies that were processed or that perform differently. These methods have commonalities in geometric characterizations at certain scales, which are observable with statistics and measurements. It also develops a semantic and theoretical framework and proposes a new system for organizing and designating multiscale analyses. Finally, future possibilities for multiscale analyses are discussed. (C) 2018 Published by Elsevier Ltd on behalf of CIRP.

Published
2018
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