89 results on '"Windover, D."'
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2. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1-x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9) - CORRIGENDUM
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3. Fixed-angle, energy-dispersive x-ray reflectivity measurement of thin tantalum film thickness
4. Thickness measurement of nm HfO2 films
5. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1–x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9)
6. Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering
7. Structural and optical properties of Ba3(Nb6−xTax)Si4O26 (x = 0.6, 1.8, 3.0, 4.2, 5.4)
8. Structural and optical properties of Ba(Co1−xZnx)SiO4 (x = 0.2, 0.4, 0.6, 0.8)
9. Real-Time XRD Characterization of Growth of Sputtered Tantalum Films
10. High-rate sputter deposited tantalum coating on steel for wear and erosion mitigation
11. In situ phase evolution study in magnetron sputtered tantalum thin films
12. Grazing Incidence Small Angle X-Ray Scattering Study on Low Dielectric Thin Films
13. Effect of sputtering parameters on Ta coatings for gun bore applications
14. Image plate X-ray diffraction and X-ray reflectivity characterization of protective coatings and thin films
15. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (Ba x Sr1– x )2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9).
16. Analysis of magnetron-sputtered tantalum coatings versus electrochemically deposited tantalum from molten salt
17. Energy-Dispersive, X-Ray Reflectivity Density Measurements of Porous SiO2 Xeorgels
18. Thin-Film Density Determination of Tantalum, Tantalum Oxides, and Xerogels by Multiple Radiation Energy Dispersive X-Ray Reflectivity
19. Residual Stress in a Swage Autofrettaged Steel Cylinder with Semi-Circular Mid-Wall Channels
20. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1–x)2CoWO6(x= 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9)
21. Structural and optical properties of Ba3(Nb6− x Ta x )Si4O26 (x = 0.6, 1.8, 3.0, 4.2, 5.4).
22. Structural and optical properties of Ba(Co1−xZnx)SiO4 (x = 0.2, 0.4, 0.6, 0.8).
23. Structural and optical properties of Ba3(Nb6−xTax)Si4O26(x= 0.6, 1.8, 3.0, 4.2, 5.4)
24. Structural and optical properties of Ba(Co1−xZnx)SiO4(x= 0.2, 0.4, 0.6, 0.8)
25. Characterisation of atomic layer deposition using x-ray reflectometry
26. Determining sample alignment in x-ray reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials
27. Characterisation of atomic layer deposition using x-ray reflectometry
28. Limitations of x-ray reflectometry in the presence of surface contamination
29. In-Situ Phase Evolution study in Magnetron-Sputtered Tantalum Thin Films
30. D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material
31. D-91 Characterizing X-ray Mirrors in Reciprocal Space: Results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer
32. High-Rate Sputter-Deposited Tantalum Coatings on a Steel Liner for Wear and Erosion Mitigation
33. X-Ray Digital Image Plate Detector for Phase and Texture Analyses of Thin Tantalum Films
34. Image Plate X-Ray Diffraction and X-Ray Reflectivity Characterization of Protective Coatings and Thin Films
35. Energy-Dispersive, X-Ray Reflectivity Density Measurements of Porous SiO2 Xeorgels
36. NIST method for determining model-independent structural information by X-ray reflectometry
37. X-Ray Diffraction Techniques and Finite Element Modeling to Control Residual Stress in High-Temperature Pressure Vessels
38. Analysis of Molten Salt and Sputter-Deposited Coatings on Steel Cylinders
39. Thin-Film Density Determination of Tantalum, Tantalum Oxides, and Xerogels by Multiple Radiation Energy Dispersive X-Ray Reflectivity
40. D-112 Quantitative Evaluation of Graded Parabolic Multilayer Optics—Invited
41. Phase, Residual Stress, and Texture in Triode-Sputtered Tantalum Coatings on Steel
42. X-Ray Determination of Texture and Residual Stress in Low Contraction Electrolytic Chromium Deposition.
43. Residual Stress in a Swage Autofrettaged Steel Cylinder with Semi-Circular Mid-Wall Channels
44. Grain Orientations in Electrolytic High Contraction and Low Contraction Chromium Deposition
45. Development of an in-line X-ray reflectivity technique for metal film thickness measurement.
46. Phase, residual stress, and texture in triode-sputtered tantalum coatings on steel
47. Properties of thick sputtered Ta used for protective gun tube coatings
48. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (Ba x Sr1- x )2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9) - CORRIGENDUM.
49. Energy-dispersive, x-ray reflectivity density measurements of porous SiO[sub 2] xerogels.
50. Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1-x)2CoWO6(x= 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9) - CORRIGENDUM
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