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Plasmonic refractive index sensors are essential for detecting subtle variations in the ambient environment through surface plasmon interactions. Current efforts utilizing CMOS-compatible, plasmo-photonic Mach-Zehnder interferometers with active power balancing exhibit high sensitivities at the cost of fabrication and measurement complexity. Alternatively, passive bimodal plasmonic interferometers based on SU-8 waveguides present a cost-effective solution with a smaller device footprint, though they currently lack opto-mechanical isolation due to exposed photonic waveguides. In this work, we introduce innovative polymer-core and polymer-cladded bimodal plasmonic refractive index sensors with high refractive index contrast. Our sensors feature an aluminum stripe, a bilayer SU-8 photonic waveguide core, and the experimental optical cladding polymer SX AR LWL 2.0. They achieve a sensitivity of (6300 $\pm$ 460) nm/RIU (refractive index unit), surpassing both traditional and polymer-based plasmo-photonic sensors. This approach enables integrated, wafer-scale, CMOS-compatible, and low-cost sensors and facilitates plasmonic refractive index sensing platforms for various applications., Comment: 30 pages

The n-type doping of Ge is a self-limiting process due to the formation of vacancy-donor complexes (DnV with n <= 4) that deactivate the donors. This work unambiguously demonstrates that the dissolution of the dominating P4V clusters in heavily phosphorus-doped Ge epilayers can be achieved by millisecond-flash lamp annealing at about 1050 K. The P4V cluster dissolution increases the carrier concentration by more than three-fold together with a suppression of phosphorus diffusion. Electrochemical capacitance-voltage measurements in conjunction with secondary ion mass spectrometry, positron annihilation lifetime spectroscopy and theoretical calculations enabled us to address and understand a fundamental problem that has hindered so far the full integration of Ge with complementary-metal-oxide-semiconductor technology., Comment: 19 pages, 5 figures, to be published at New J. Phys