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The RAMI4.0 model consists of three axes; the Layers axis, the Hierarchy axis, and the Life Cycle Value Stream axis. This model unifies the various aspects of I4.0 to allow data generated from manufacturing and business activities to be shared effectively. The Manufacturing Chain Management software aims to provide a platform where all three axes and their associated data are tightly integrated and can be used to provide I4.0 connectivity as well as insights into the manufacturing supply chain. A data framework is proposed whereby the data from these activities can be collected and used to make more insightful decisions about an organisations value chain, value stream, and the life cycle of their product portfolio. The MCM platform is aimed at SMEs, which generally has lesser financial ability to invest into I4.0 technologies. Hence, the MCM platform is designed to be flexible and scalable whilst maintaining compliance with international I4.0 standards. A furniture factory in Selangor, Malaysia has been chosen to implement the Value Stream Mapping aspect of the life cycle management tools in their manufacturing line to test its effectiveness.

Mass production of individualized products becomes essential for delivering personalized customer experience in the Industrial Revolution 4.0 era. Developing seamless value chain integration between enterprises, such as suppliers, retailers, and manufacturers, to achieve mass production of individualized products is challenging. This paper proposes a method of asset integration and asset data channeling between enterprises in a value chain, namely Asset Administration System (AAdSys), designed based on RAMI 4.0. A use case that involves PEC application and OMIS manufacturing line for full automation of individualized mixed juice production is developed. The use case demonstrates how data channeling between a retailer and a manufacturer using AAdSys can be done.

The environmental and agricultural monitoring system used the Internet of Things (IoT) Technologies and computer vision to tackle the agriculture sector problems by using an actual farm site and real-time crops monitoring solution as a test bed. Various types of data are placed everywhere in the farm to monitor the crops and environment 24/7, as well as measuring plant’s growth rate and healthiness using computer vision. This system addressed considerations and limitations of the agriculture sector by using the industrial standard devices to ensure it can sustain under extreme environment. Data is considered as a rich asset in this era, the data collected will be processed into comprehensive information and visualized in an easy understandable user interface. Overall, this system serves the farmers with the precise past and real-time environment data, giving the farmers to have an overview of their farm environment and lead to better strategic decisions.

Dark-field optical scattering technique is adopted in a surface defect detection system (DDS) to allow an efficient and cost-effective detection and size determination of the crystal originated "particles" (COPs) on polished silicon wafer surface before atomic force microscope (AFM) measurement. The effects of laser beam power, beam angle, beam profile, wafer rotation and intensified CCD (ICCD) camera exposure time on the scattered light diameter of preselected COPs were investigated. An AFM was integrated to the DDS through coordinate linkage to confirm the diagonal length, shape and type of the COPs detected. A correlation curve between the scattered light diameters and the actual diagonal lengths of the COPs was then obtained. Once the correlation is established, the size of COP on any wafer surface can be estimated simply by referring to the correlation curve without constant reference to the AFM. In this study, the detection of a single-type COP with a diagonal length of 60 nm was demonstrated.

A surface particle localization system based on oblique angle dark field optical scattering has been incorporated into time-of-flight secondary ion mass spectrometry. (TOF-SIMS) In this design, oblique incident laser light would be scattered to all directions by surface particles on silicon wafer and be collected at oblique angle to determine the x-y coordinate of the particle detected. This fast and nondestructive technique is an effective alternative to the standard method for imaging and localization of surface particles using primary ion bombardment by TOF-SIMS which might result in the alteration or loss of physiochemical information from the surface particles. (C) 2005 The Electrochemical Society.

Surface analyses by atomic force microscopy and field-emission scanning electron microscopy have revealed new shape of truncated voids, commonly known as crystal-originated-particles (COPs), that appear as kite-shaped pits with two (111) planes and two non-(111) planes in twin and triplet clusters, when viewed from the surface plane of nitrogen-doped Czochralski (CZ)-grown silicon (100) wafers. Also, the detection of higher number density but smaller size for these COPs indicates that the presence of nitrogen during CZ-growth of silicon crystals has strong influence on the size and density of COPs. (C) 2004 The Electrochemical Society.