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As many professionals near the traditional retirement age, organizations are finding themselves facing a potential mass exodus of their most senior and experienced employees. These potential retirees have a knowledge inventory accrued through a career of successes and failures in their fields. This knowledge base is often the foundation of decisions that enhance operational efficiency, foster innovation, reduce the occurrence of critical errors, and enable corporate growth strategies. This paper addresses the increased rate of knowledge loss in the capital projects industry. The authors conducted case studies, interviews, and surveys to frame the problem and understand what constitutes a successful experiential knowledge-retention program in capital projects organizations. The result is an experiential knowledge-retention management model that aids in the implementation of a corporate knowledge-retention program, assesses current risk of experiential-knowledge loss across organizational knowledge ...

A method is presented for detecting, counting and mapping micropipes and dislocations in n+, undoped, and semi-insulating Silicon Carbide wafers. The technique is based on etching in molten Potassium Hydroxide (KOH), and it employs image processing that automatically detects etch pits, discriminates between micropipes and dislocations, and generate micropipe and dislocation density maps. We demonstrate a novel way of detecting and mapping dislocations and micropipes in semi-insulating SiC. This is achieved by combining a properly tuned etching technique that reliably produces well defined etch pits with image processing that enables quick and accurate analysis of the etch pit contrast. We show that the results of optical evaluation are close to those obtained using the Synchrotron White Beam X-Ray Topography (SWBXT) technique.